[01] Alexey Utkin Igorevich, Theoretical Physics Department, Moscow State Regional University, Moscow, Russia. [02] Alexander Yushkanov Alexeevich, Theoretical Physics Department, Moscow State Regional University, Moscow, Russia.

Interaction of electromagnetic H-wave with thin metal film is located between two dielectric environments ε1, ε2 in the case of different incident angles of H-wave θ and in the case of different reflection coefficients q1 и q2 is calculated in this article. Behavior analysis of reflection coefficient R, transmission coefficient T and absorption coefficient A in the case of its frequency dependence y and variation dielectric permeability of its environments is done.

The Thin Metal Film, Electromagnetic H-Wave, Dielectric Environments, Reflection Coefficient, Transmission Coefficient, Absorption Coefficient

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